Connected Online Tester SRC AL309

Basic Information:

• Product Name: Inline Circuit Board Manufacturing Fault Analysis System

• Product Model: SRC AL309

Product applications:

1. PCB Testing Circuit open and short circuits, as well as the soldering conditions of all components—including missing or misaligned parts, component parameter deviations, solder bridging at joints, and board-level open/short circuit faults—and accurately identify the fault locations.

2. In addition to the component testing function, it also features TestJet. – Functional testing of programmable power output, voltage and current acquisition, and chip programming capabilities.

Product features:

Core Technology Innovation ---- Faster testing speed, higher test accuracy and stability, and more flexible scalability.

1. The test allows seamless switching between single-core, dual-core, and quad-core modes, all controlled by software. No hardware changes are required—this solution seamlessly integrates large circuit boards with multiple connection points and smaller multi-panel boards, enabling highly efficient detection.

2. Four-probe eight-wire detection technology effectively eliminates the influence of probe contact resistance, ensuring stable measurements down to as low as 0.01. Ou's resistance value can be measured down to 1 milliohm.

3. By applying dual-channel high-speed synchronous acquisition technology, we simultaneously enhance both testing speed and accuracy.

4. Programmable power supplies offer greater flexibility, enabling them to meet the diverse power supply requirements of various products under test.

Innovative operational practices ---- Programming is more convenient, method combinations are more flexible, and data management is more secure.

1. A DIY programming mode that allows for secondary development, enabling users to easily create custom combination testing methods for specialized devices.

2. The discharge points are editable, and a combination of pre-test, post-test, single-step discharge, and full-board discharge methods is employed to effectively protect both the test system and the circuit board under test.

3. The signal source can be set automatically or adjusted manually. Manual adjustments allow users to fine-tune the signal source signal, accommodating specific requirements.

4. Single-step automatic loop test function, making it convenient for engineers to debug the board under test.

5. Utilize tabular programming to easily create test steps and adjust their sequence.

6. Flexible jig testing allows simultaneous testing of identical and different jigs on a single fixture, while the jig programming sequence can be duplicated for rapid, efficient programming.

7. Needle gauge settings can be freely defined, making it easy to create the needle bed.

8. Four-level permission management and data-tiered password protection ensure safer and more reliable test program data management.

Innovative Structural Design ---- The structural design is more rational, the fixtures are easier to change, and operational maintenance costs are lower.

1. The uniquely designed channel plate layout optimizes interface dimensions, making needle bed production more cost-effective and efficient.

2. The uniquely designed channel plate plug-in mechanism eliminates the need for maintenance from both the left and right sides of the equipment, reducing both maintenance complexity and the machine’s footprint.

3. The needle bed pressure height is software-configurable, allowing for a second downward press during testing, and it’s compatible with both high and low probes.

4. The rail can automatically adjust its width based on software settings, reducing the need for manual intervention and enhancing the precision of the adjustment.

5. The uniquely designed, custom-made probe directly connects to the fixture, minimizing wire resistance interference and ensuring more stable device performance.

6. The needle bed is replaced with protection, ensuring it remains undamaged.

7. Innovative interface needle protection device prevents contamination of the interface needle, virtually ensuring maintenance-free operation of the needle throughout its lifespan.

8. Customized dedicated interface pins minimize coating damage and contamination caused by probe contact areas, preventing excessive conductivity issues. These interface pins are designed to require no maintenance throughout their lifetime.

9. Automatic needle bed recognition: If the upper and lower needle beds don’t match, the system will not apply pressure, preventing damage to the needle beds due to mismatched alignment.

10. Each sport is monitored to enhance system security.

11. The unique equipment and fixture docking system enables rapid fixture changes, significantly reducing changeover time.

12. Added fixture installation guides to make handling the fixtures easier and less labor-intensive, laying the groundwork for automating the transportation and installation of heavy-duty fixtures.

Technical specifications:

Open circuit / Short circuit

• Test method: Single-point to multipoint

• Programming Approach: Auto-Learning

• Test threshold: 5Ω ~ 20Ω ~ 80Ω (default) Customizable threshold from 5 to 1 kΩ

• Test current: ≤10mA

• Test speed: 1024 points/s (open circuit)

• Number of configurable thresholds: 8

Test Point Count

• Standard: 1024 points

• Maximum score: 4096

• Switchboard: 256 points per unit

Component Testing

• Test voltage: -10V to +10V

• Test current: 0.1 µA to 100 mA

Resistance

• Test range: 0.1–40M

• Stimulus Voltage: 0–5V (Programmable)

• Stimulus Current: 0.1 µA to 10 mA

The accuracy figure is based on independent testing of the resistor component; when calculating the overall accuracy, the resistance of the test system's connecting wires should first be subtracted.

Two-needle measurement method:

Test Scope	Accuracy	Test time
<100Ω	±(1% + 1)	4 ms
100Ω to 500KΩ	±1%	5 ms
500 kΩ to 5 MΩ	±2%	5–20 ms
5 MΩ ~ 40 MΩ	±4%	20–30 ms

 

 

 

 

 

 

Four-needle method measurement:

Test Scope	Accuracy	Test time
<1Ω	Resolution down to 10 mΩ	10ms
1Ω ~1K Ω	±1%	10ms

 

 

Capacitance Testing

• Test range: 5 pF to 40 mF

• Stimulus voltage: 100 mV to 10 V (programmable)

• Stimulus frequency: 10 Hz to 1 MHz

• Stimulating current: 0.01 µA to 50 mA

• The accuracy figure is based on independent testing of the capacitor component; when calculating the overall accuracy, the system's distributed capacitance should first be subtracted.

Test Scope	Accuracy	Test time
5p ~1nF	± (3% + 0.5p)	5 ms
1 nF ~ 1uF	±2%	5 ms
1 µF ~ 1mF	±2%	15 ms
1 mF ~40 mF	±3%	20 ms

 

 

 

 

 

 

 

Jumper wire: 1Ω–1kΩ adjustable (with resistor-level accuracy)

PN Junction Forward Conduction Characteristics: 0–5 V

Diode: PN Junction Curve Testing, Forward and Reverse Voltage Drop Testing, Multi-PN Parallel Connection

Voltage regulator: 0–18V

Transistor On-State Test: 250mV to 10V, with an excitation current of 10mA

Transistor β Value Test: β value ranges from 1 to 1000, with a drive current of ≤10mA (in a non-network environment), and an accuracy of ±5%.

Multi-pin devices: optocouplers, field-effect transistors, thyristors, potentiometers, relays, connectors, and more. Driving current: 0–10 mA; driving voltage: 0–10 V.

Capacitor Polarity: Three-pin measurement, metal casing, 1 µF to 40 mF

Transformer: Turns ratio, accuracy 3%

Voltage Sensing Test: IC Pin Open Circuit

Automatic discharge function: All configured capacitance test steps, as well as custom needle-point-to-constant-current discharge and full-board discharge, are performed with the voltage dropping below 10V.

Power Supply: Standard Configuration: 0–60V / 3A / 180W × 2, 0–6V / 3A / 15W × 1. Expandable Channels: Up to 9 channels, with power supplies available for flexible customization based on your needs.

Voltage measurement; Measurement range: -100 to 100, accuracy ±0.5% + 10mV

Frequency measurement: 1 Hz to 50 MHz, accuracy ±0.01% + 5 Hz; 50 MHz to 100 MHz, accuracy ±0.1% + 10 Hz; Channels: 16 single-point-to-ground channels

Firmware Flashing: JTAG, IIC, and SPI Programming

Shorting: Number of paths: 16; Shorting method: Each path can be shorted to ground (common terminal), or alternatively, each pair of points can be shorted together.

Digital Circuit Testing:

Single-board channel count: 64, with each digital channel having one output and one input;

Input level voltage range: -1V to 5.5V;

Output high-level voltage range: 2.5V to 5.5V;

Output low-level voltage range: -1V to 2V;

Single-channel output capacity: 200mA; single-group current capacity: 1A;

Input level threshold voltage range: 1–4 V;

Maximum operating frequency: 2 MHz;

Voltage rise rate: 400 V/µs;

Maximum DS count per single movement: 1024;

Output high and low levels: in 64-bit groups.