Smart Microscope: Detects Micron-Scale Dust Particles Inside Mobile Phone Cameras
Release date:
2025-05-28 15:51
Source:
In the age of precision manufacturing, quality control demands "sharp eyes and a keen mind"! We are introducing AI Smart microscope, designed specifically for 3C Built for the electronics and semiconductor industries, this one-click system detects micron-level defects, helping companies achieve zero-defect production.
Core Advantages
Core Advantages
- Precise identification 1200 Megapixel camera + Custom lenses, precisely capturing ≥ 0.1mm Defects such as dust spots and light leaks are detected in real time, eliminating the risk of human error in judgment.
- Smart Traceability The system automatically uploads inspection results, supports scan-based traceability, automatically alerts and halts defective products, and enables end-to-end digital management.
- Highly Efficient Operation Compatible with multiple device models, enabling "zero-wait" switching for enhanced efficiency. 50%， CT Time ≤ 10s , uptime rate ≥ 98.5% ！
High-end specifications
- Advantech i7 Host machine +16GB Memory, running smoothly
- XYZ Modular Slide Table + Anti-static design, compatible with multi-size samples
- The software is permanently free, with no encryption restrictions and fully open and compatible.
Lens aperture
Precisely detect dust particles and light leakage in the non-window areas, reducing the risk of "gourd-shaped screen" defects. Measured data: Missed detection rate 0% , product defect rate 0.1% , Local minimum storage time 7 Goodness, the data is traceable.
Equipment Operation Process
